Sony IMX711-AABY
Diagonal 59.8 mm (Type 3.73) Direct-Conversion X-ray CMOS Image Sensor
The Sony IMX711-AABY is a stacked CMOS image sensor engineered for direct X-ray detection in scientific and measurement instrumentation. A 650 µm thick FZ silicon substrate converts X-ray photons directly into electrical signals, eliminating the scintillator layers required by indirect-conversion designs. With a maximum frame rate of 26.1 k frames/s in all-pixel scan mode and noise as low as 0.018 photons, the IMX711-AABY enables single-photon sensitivity alongside a high saturation count rate up to 600 M cps.
- Target Applications
- Key Features
- Technical Specifications
The IMX711-AABY is designed for demanding X-ray and electron beam detection systems used in scientific instrumentation, including:
- Synchrotron and free-electron laser (XFEL) beamline detectors
- High-speed X-ray diffraction and scattering analysis
- Electron microscopy and beam imaging
- Industrial X-ray inspection and quality metrology
- Scientific measurement systems requiring single-photon sensitivity
For 12 keV X-rays: saturation signal level of 1,800 photons/frame (Mode-C Cont/HDR), saturation count rate of 30 M cps (Mode-C Cont) or 600 M cps (Mode-C HDR), and noise of 0.018 photons (Mode-C Cont/HDR) for single-photon detection at high dynamic range.
- Stacked structure: 650 µm FZ silicon photodiode substrate + dedicated signal processing chip
- Direct X-ray conversion - no scintillator required
- 280K active pixels (384 H × 728 V) with 72.6 µm square pixel pitch
- Maximum frame rate: 26.1 k frames/s (all-pixel); 117.5 k frames/s (1/8 ROI)
- 48-lane SLVS-EC high-speed serial output at 2.88 Gbps per lane
- 12-bit A/D converter with in-pixel CDS and automatic gain switching (High / Middle / Low)
- Variable-speed global shutter for precise exposure control
- ROI readout modes: 1/2, 1/4, and 1/8 for increased frame rate
- A/D multisampling (up to 16x) for noise reduction in low-dose applications
- Built-in PLL, OTP memory, and on-chip thermometer
- Chip Size Package (CSP): 30.357 mm × 69.738 mm
| Parameter | Value |
|---|---|
| Image size | Diagonal 59.8 mm (Type 3.73) 27.88 mm (H) × 52.85 mm (V) |
| Number of active pixels | 384 (H) × 728 (V) - 16*1 Approx. 0.28 megapixels |
| Unit cell size | 72.6 μm (H) × 72.6 μm (V) |
| Substrate material | Silicon |
| Sensor thickness | 650 μm |
| Frame rate (All-pixel readout) | 26.1 k fps (Mode-A) 17.4 k fps (Mode-C Cont, HDR) |
| Noise | Typ 34 e-rms*2 Max 60 e-rms |
| Saturation count rate (12keV) | 0.94 Mcps/pixel (Mode-A) 33 Mcps/pixel (Mode-C Cont) 600 Mcps/pixel (Mode-C HDR) |
| Output interface | SLVS-EC |
| Package | Chip Size Package (CSP) : 30.36 mm (H) x 69.74 mm (V) |
Specifications at Tj = 20°C. See Sony IMX711-AABY datasheet for complete electrical and optical specifications.
Macnica Support
Interested in the IMX711-AABY for your X-ray detector or scientific imaging system? Contact the Macnica Americas team to discuss your application requirements and request samples.
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