Sep 17, 2025

Unlocking the Hidden Spectrum: Sony SWIR Imaging with Macnica

Imaging and Vision: Sensor-to-solution support for high-res inspection systems

Short-wave infrared, SWIR, is moving from niche labs into real factory lines and field systems. Our new whitepaper explains how Sony’s SenSWIR image sensors bring visible-to-SWIR sensitivity into a single device, why that matters for inspection and sensing, and how Macnica helps you turn sensors into working solutions.

 

What you will learn from the whitepaper

  • SWIR fundamentals: What SWIR is, how it behaves differently from visible light, and when to use shorter versus longer SWIR bands
  • Sony SenSWIR technology: Broadband 400–1700 nm sensitivity in one sensor, Cu-Cu bonding for small pixels and higher resolution, low-noise readout, and digital output that simplifies system design
  • Sensor lineup highlights: IMX990 and IMX991 for compact builds, IMX992 and IMX993 for higher precision up to 5.32 MP
  • High-value applications: Semiconductor wafer and package inspection, food and agriculture quality control, safety and environmental monitoring, medical and life-sciences, laser and industrial process monitoring, and research
  • Design checklists: Lenses and coatings for SWIR, filter choices, illumination guidance, thermal and ISP considerations, and SLVS or MIPI interface planning
  • How Macnica accelerates success: Evaluation kits, optics and filter selection, data-path and FPGA help, calibration and image-quality tuning, and supply chain readiness from prototype to production
  • A practical case study: A wafer inspection project using the IMX992 that improved defect detection, increased yield, and shortened deployment time

 

Why this matters

Combining visible and SWIR in one device reduces camera count, simplifies integration, and lowers total system cost. With higher resolution, lower noise, and a modern digital interface, SenSWIR helps you see defects, moisture, contaminants, and patterns that visible-only cameras miss. Pair that with Macnica’s sensor-to-solution support and you get faster time to demo, faster time to production, and lower program risk.

 

Who should read it

  • Machine vision and automation teams building inspection systems
  • Imaging engineers exploring multi-spectral capture without dual cameras
  • Product leaders evaluating SWIR for safety, medical, or environmental monitoring
  • Researchers needing compact, high-resolution SWIR sensors with visible overlap

 

Read the full whitepaper

 

 

 

 

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